목록측정/계측/검사/시험기 (2813)
여기에 기계
제품코드G050208판매 회사명(주)지티에스코리아연락처055-288-2914홈페이지-제품홍보관- ※ 출처 : 여기에 기계플라자 - [G050208] KOBA
제품코드G050204판매 회사명(주)지티에스코리아연락처055-288-2914홈페이지-제품홍보관- ※ 출처 : 여기에 기계플라자 - [G050204] STEINMEYER
제품코드G050201판매 회사명(주)지티에스코리아연락처055-288-2914홈페이지-제품홍보관- ※ 출처 : 여기에 기계플라자 - [G050201] WERTH
제품코드G050200판매 회사명(주)지티에스코리아연락처055-288-2914홈페이지-제품홍보관- ※ 출처 : 여기에 기계플라자 - [G050200] MAHR
제품코드G050146판매 회사명냅슨코리아연락처02-3432-1008홈페이지-제품홍보관http://blog.yeogie.com/napson 특징- Measuring range : 50μS~20mS - Applications : Silicon ingot, Silicon bulk, Prismatic shape (JIS code) - Bulk sizes : Contact us in details 상세설명- Minority carrier lifetime tester for silicon Ingot (잉곳 소수 캐리어 수명 측정장치) - JIS direct current anodizing method - Photoconductive decay method - Global standard model for the l..
제품코드G050145판매 회사명냅슨코리아연락처02-3432-1008홈페이지-제품홍보관http://blog.yeogie.com/napson 특징- Rs : 0.01~3000 Ω/sq - Applications : Conductive layers on glass or film - Sample sizes : Contact us in details 상세설명- Automatically measures sheet resistance - For ITO, metal and conductive layers on film or glass - Easy operation with PC - System is designed for small footprint in clean room - Non-contact Eddy curre..
제품코드G050144판매 회사명냅슨코리아연락처02-3432-1008홈페이지-제품홍보관http://blog.yeogie.com/napson 특징- Rs:5.0mΩ/sq~10.0MΩ/sq - Res:1.0mΩ?cm ~300kΩ?cm ( t=100~2000μm ) - Applications : Silicon wafer, conductive layer on glass/film and more - Sample size : 2"~8"Ф, max.156mmSQ 상세설명- All-in-one instrument of resistivity tester and measuring stage (Small foot print) - Without PC operation (stand-alone use) or PC operate s..
제품코드G050142판매 회사명냅슨코리아연락처02-3432-1008홈페이지-제품홍보관http://blog.yeogie.com/napson 특징-Res : 10μ~100k?Ωcm -Applications : Semiconductor materilas, Solar-cell materials (Silicon, Polysilicon, SiC etc) Conductive thin film (Metal, ITO etc) Others (*Please contact us for details) -Sample sizes : φ10mm or 5mmX10mm~35mmX35mm or others 상세설명- Controlled Thermo-chuck (room temperature~600℃/less than 20 minutes..